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Component Spectrum Analyzer® (Model 2004)
The Model 2004 Component Spectrum Analyzer™ has been discontinued.
Replaced by the 4650 for swept based applications.
Replaced by the 4600 for fixed laser source applications.
 Fast, Accurate Passive Component Test System
Fast IL, PDL and ORL Measurement Across Wavelength
The Model 2004 Component Spectrum Analyzer™ characterizes loss, polarization dependency and return loss quickly, accurately and repeatably—all at an affordable cost. dBm Optics’ technology supports unprecedented optical repeatability, accuracy, and speed. A device can be characterized over a 100 nm span at 1 pm resolution with 1 pm and 0.015 dB accuracy in less than 1 second.

Repeatable Loss Measurements
Loss measurements normally require a reference measurement—then a measurement of the loss. The Model 2004 eliminates the need for the reference measurement entirely by using a proprietary real-time reference. The Model 2004 is constantly monitoring the input power to the device and calculating the loss based on the power out of the device. In addition to speeding the measurement and eliminating the reference errors, the Model 2004 eliminates the effect of variation in the source power between the reference and the loss measurement. The result: the most accurate loss measurements available anywhere.

Fast, Accurate Polarization Dependency Measurements
The PDL meter function of the Model 2004 performs fast and accurate measurement of the polarization dependency of the device using either all-state or matrix method. The matrix method will characterizing 100,000 points of PDL in approximately 1 second.

Simultaneous Return Loss Measurements
High dynamic range allows the Model 2004 to characterize return loss to levels approaching -70 dB. This measurement is performed simultaneously with the loss and polarization measurements (no additional time required).

The Model 2004 quickly measures PDBW, PDCW, and filter bandwidth.

 Photodiode Test System

The dBm Optics’ photodiode test system allows suppliers of PIN and APD photodiodes to characterize the parametric performance of their components in R&D, QA and production. Photodiode responsivity is tested across wavelength and has unparalleled speed and accuracy in polarization dependent responsivity (PDR) measurement. Both the traditional all-states PDR and the faster, more accurate 4-state and 6-state PDR measurement methods are supported by this system.

New Photodiode Test System