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Optical Component Characterization Instruments
dBm Optics combines best-in-the-industry measurement technology with proprietary techniques for reducing or eliminating system errors for a line of comprehensive component characterizers which are unparalleled. Our component characterizers are used around the world by leading component suppliers.

 PDL Meter: PDL/IL/ORL (Model 4600)
PDL/IL/ORL
The Model 4600 PDL Meter will characterize loss, polarization dependency and return loss, quickly, accurately, and with repeatability — all at an affordable cost.

Multi-Channel Capability
The Model 4600 PDL Meter can be configured with internal switching and/or multiple channels to allow testing of multi-channel and multi-DUT component testing.

  • IL and ORL simultaneously measured in less than 1 second over a 100 nm band
  • IL, ORL and PDL simultaneously measured in less than 8.5 seconds over a 100 nm band
  • > 100 dB total dynamic range; > 65 dB dynamic range at full speed
  • Low PDL error and high repeatability
  • Real-time referencing reduces test time and increases accuracy
  • Built-in fixed wavelength sources, typically 980 nm, 1310 nm, 1490 nm, 1550 nm, 1625 nm
    (other wavelengths also available)
  • Built-in or external polarization controller
  • Large color display makes data visualization and analysis simple
  • Communicate over GPIB or Ethernet
  • Exchange data using a USB flash drive
  • 1 or 2 channels
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 Swept Spectrometer® (Model 4650)
Fast, Accurate Swept IL/PDL/ORL
The 4650 Swept Spectrometer® will characterize loss, polarization dependency and return loss as a function of wavelength, with accuracy and repeatability—all at an affordable cost. dBm Optics’ technology supports unprecedented optical repeatability, accuracy, and speed. A device can be characterized over a 100 nm span at 1 pm resolution with 1 pm and 0.005 dB accuracy in less than 1 second.

  • IL and ORL simultaneously measured in less than 1 second over a 100 nm band
  • IL, ORL and PDL simultaneously measured in less than 8.5 seconds over a 100 nm band
  • > 100 dB total dynamic range; > 65 dB dynamic range at full speed
  • Low PDL error and high repeatability
  • Real-time referencing reduces test time and increases accuracy
  • Built-in or external TLS or fixed wavelength sources
  • Built-in or external polarization controller
  • PDL Measurement in less than 8½ seconds
  • Large color display makes data visualization and analysis simple
  • Communicate over GPIB or Ethernet
  • Exchange data using a USB flash drive
  • 1 or 2 channels
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 Component Spectrum Analyzer® (Model 2004)
Fast, Accurate, Flexible Swept IL/PDL/ORL
The Model 2004 Component Spectrum Analyzer%reg; (CSA) will characterize loss, polarization dependency and return loss quickly with accuracy and repeatability—all at an affordable cost. Characterize a device over 100 nm at 1 pm resolution with 1 pm and 0.005 dB accuracy in <1 second. Many functions can be added to the CSA system, including dispersion measurement, digital I/O and tunable lasers.

  • IL and ORL simultaneously measured in less than 1 second over a 100 nm band
  • IL, ORL and PDL simultaneously measured in less than 8.5 seconds over a 100 nm band
  • > 100 dB total dynamic range; > 65 dB dynamic range at full speed
  • Low PDL error and high repeatability
  • Real-time referencing reduces test time and increases accuracy
  • Built-in or external TLS or fixed wavelength sources
  • Built-in or external polarization controller
  • Large color display makes data visualization and analysis simple
  • Communicate over GPIB or Ethernet
  • Exchange data using a USB flash drive
  • 1-40 or up to 1500 channels
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 Photodiode Characterizer (Model 4700)
Complete Photodiode Measurement System
The Model 4700 Photodiode Characterizer is a complete photodiode test system. It will characterize PDs or APDs without the need for additional power supplies. It is this simple: Connect your device and press start. dBm Optics’ precision measurement technology allows very high current resolution and accuracy to capture dark currents and precise responsivity data.

  • Simultaneous responsivity, PDR, and return loss measurement across wavelength
  • Measure linearity to < 0.05 dB
  • Cover telecom photodiode wavelengths 800-1700 nm
    (pumps, O-, E-, S-, C-, L- and U-band) with a TLS, and 200-2000 nm with a monochrometer
  • Measure directly from the photodiode, or 0-10V from a transimpedance amplifier
  • Test embedded PD in amplifiers simultaneous with optical parametric tests
  • Great absolute accuracy, measurements down to < 200 fA
  • > 100 dB total dynamic range
  • Confirm polarization dependent responsivity to < 0.005 dB
  • Linearity measurement to +/-0.05dB
  • High-speed measurement: 100,000 rps
  • Large color display makes data visualization and analysis simple
  • Communicate over GPIB or Ethernet
  • Exchange data using a USB flash drive
  • 1 or 2 channels
  • Testing integrated photodiodes in devices like triplexers and diplexers
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